Extreme High Vacuum System for 3D-Atom Probe

Extreme High Vacuum System for 3D-Atom Probe

3D - Atom Probe (or Atom Probe Tomography) is a material analysis technique offering extensive capabilities for both 3D imaging and chemical composition measurements at the atomic scale. The images of each atom's position on the sample tip are obtained by using a position sensitive detector invented by Prof A. Cerezo in 1988, which investigates the first location of flying atoms on the tip surface and also atomic species by measuring the time of flight of the flying atoms. The cubic array of the tip material atoms can be reconstructed in 3-dimensional image by repeating progressive removal of the atoms of the tip, making use of field evaporation phenomenon.

3D-Atom Probe is made by Atom Probe Group in University of Oxford. ( http://www.materials.ox.ac.uk/fim/ )
3D-Atom Probe is made by AMETEK, Inc - CAMECA SAS. ( http://www.cameca.fr/ )

National Institute for Materials Science ( http://www.nims.go.jp/apfim/exhibition_j.html )
Kanazawa Institute of Technology ( http://www2.kanazawa-it.ac.jp/nanotech/ )
Tohoku University ( http://apfim.imr.tohoku.ac.jp/ )
etc.